- 使用性能出眾的微波網絡分析儀，應對苛刻的測量挑戰(zhàn)
- 在測量 S 參數時實現超低的不確定度和超高穩(wěn)定度
- 利用應用軟件簡化設置，高效表征有源器件
- 通過定制化配置得到恰當的性能，滿足您的特殊預算和測量需求
- 多點觸控屏和直觀的用戶界面加速對元器件特性的分析
選件
| N5224B-200 | 2-port, base hardware configuration |
| N5224B-201 | 2-port with configurable test set, reference mixer switch |
| N5224B-205 | 2-port with configurable test set, ref mixer switch, bias tees, low frequency extension |
| N5224B-210 | 2-port with metrology configuration |
| N5224B-217 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators |
| N5224B-219 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
| N5224B-220 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
| N5224B-400 | 4-port with second source |
| N5224B-401 | 4-port with second source, configurable test set, reference mixer switch |
| N5224B-405 | 4-port with second source, configurable test set, reference mixer switch, bias tees, low frequency extension |
| N5224B-410 | 4-port with second source, metrology configuration |
| N5224B-417 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators |
| N5224B-419 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
| N5224B-420 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
